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UNE-EN IEC 60747-15:2024 UNE
Status: Current/ 2025-01-01
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (Endorsed by Asociación Española de Normalización in January of 2025.)
UNE-EN IEC 60747-16-9:2024 UNE
Status: Current/ 2024-12-01
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (Endorsed by Asociación Española de Normalización in December of 2024.)
UNE-EN IEC 63364-1:2023 UNE
Status: Vigente/ 2023-03-01
Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
UNE-EN IEC 60747-16-8:2023 UNE
Status: Vigente/ 2023-02-01
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
UNE-EN IEC 60747-16-7:2023 UNE
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)
UNE-EN IEC 62031:2020/A11:2022 UNE
Status: Vigente/ 2022-09-28
LED modules for general lighting - Safety specifications
UNE-EN IEC 63373:2022 UNE
Status: Vigente/ 2022-05-01
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (Endorsed by Asociación Española de Normalización in May of 2022.)
UNE-EN IEC 63244-1:2021 UNE
Status: Vigente/ 2021-12-01
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
UNE-EN IEC 60747-17:2020/AC:2021-02 UNE
Status: Vigente/ 2021-03-01
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)
UNE-EN IEC 60747-17:2020 UNE
Status: Vigente/ 2021-01-01
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in January of 2021.)
UNE-EN IEC 62384:2020 UNE
Status: Vigente/ 2020-10-07
DC or AC supplied electronic controlgear for LED modules - Performance requirements
UNE-EN IEC 60747-5-5:2020 UNE
Status: Vigente/ 2020-10-01
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN 60747-16-5:2013/A1:2020 UNE
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN IEC 62031:2020 UNE
Status: Vigente/ 2020-06-24
UNE-EN IEC 60747-16-6:2019 UNE
Status: Vigente/ 2019-10-01
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
UNE-EN IEC 62969-4:2018 UNE
Status: Vigente/ 2018-10-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
UNE-EN IEC 62969-3:2018 UNE
Status: Vigente/ 2018-08-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
UNE-EN IEC 62969-2:2018 UNE
Status: Vigente/ 2018-06-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN IEC 62969-1:2018 UNE
Status: Vigente/ 2018-03-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in March of 2018.)
UNE-EN 60747-16-3:2002/A2:2017 UNE
Status: Vigente/ 2018-01-01
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by Asociación Española de Normalización in January of 2018.)
UNE-EN 60747-16-4:2004/A2:2017 UNE
Status: Vigente/ 2017-12-01
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (Endorsed by Asociación Española de Normalización in December of 2017.)
UNE-EN 60747-16-1:2002/A2:2017 UNE
Status: Vigente/ 2017-07-01
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by Asociación Española de Normalización in July of 2017.)
UNE-EN 62047-25:2016 UNE
Status: Vigente/ 2017-01-01
Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (Endorsed by Asociación Española de Normalización in January of 2017.)
UNE-EN 62047-26:2016 UNE
Status: Vigente/ 2016-06-01
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures (Endorsed by AENOR in June of 2016.)
UNE-EN 62047-1:2016 UNE
Status: Vigente/ 2016-05-01
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (Endorsed by AENOR in May of 2016.)
UNE-EN 62047-17:2015 UNE
Status: Vigente/ 2015-08-01
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (Endorsed by AENOR in August of 2015.)
UNE-EN 62047-16:2015 UNE
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films – Wafer curvature and cantilever beam deflection methods (Endorsed by AENOR in August of 2015.)
UNE-EN 62047-20:2014 UNE
Status: Vigente/ 2014-11-01
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (Endorsed by AENOR in November of 2014.)
UNE-EN 62047-21:2014 UNE
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (Endorsed by AENOR in November of 2014.)
UNE-EN 62047-22:2014 UNE
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (Endorsed by AENOR in November of 2014.)
UNE-EN 62047-19:2013 UNE
Status: Vigente/ 2013-11-01
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
UNE-EN 62047-18:2013 UNE
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)
UNE-EN 62047-11:2013 UNE
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (Endorsed by AENOR in November of 2013.)
UNE-EN 60747-16-5:2013 UNE
Status: Vigente/ 2013-10-01
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
UNE-EN 60747-15:2012 UNE
Status: Vigente/ 2012-06-01
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-9:2011 UNE
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-14:2012 UNE
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-13:2012 UNE
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-12:2011 UNE
Status: Vigente/ 2012-02-01
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (Endorsed by AENOR in February of 2012.)
UNE-EN 62047-10:2011 UNE
Status: Vigente/ 2011-12-01
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)
UNE-EN 62047-5:2011 UNE
Status: Vigente/ 2011-11-01
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (Endorsed by AENOR in November of 2011.)
UNE-EN 62047-7:2011 UNE
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (Endorsed by AENOR in November of 2011.)
UNE-EN 62047-8:2011 UNE
Status: Vigente/ 2011-09-01
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
UNE-EN 60747-16-4:2004/A1:2011 UNE
Status: Vigente/ 2011-04-01
Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (Endorsed by AENOR in April of 2011.)
UNE-EN 62047-4:2010 UNE
Status: Vigente/ 2011-02-01
Semiconductor devices - Micro-electromechanical devices -- Part 4: Generic specification for MEMS (Endorsed by AENOR in February of 2011.)
UNE-EN 62047-6:2010 UNE
Status: Vigente/ 2010-06-01
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (Endorsed by AENOR in June of 2010.)
UNE-EN 60747-16-3:2002/A1:2009 UNE
Status: Vigente/ 2009-07-01
Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by AENOR in July of 2009.)
UNE-EN 60747-16-1:2002/A1:2007 UNE
Status: Vigente/ 2007-05-01
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001/A1:2007). (Endorsed by AENOR in May of 2007.)
UNE-EN 62047-2:2006 UNE
Status: Vigente/ 2007-01-01
Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)
UNE-EN 62047-3:2006 UNE
Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
