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Standard
UNE-EN 60749/A2:2002

UNE-EN 60749/A2:2002

Dispositivos semiconductores. Ensayos mecánicos y climáticos.

Semiconductor devices - Mechanical and climatic test methods.

Dispositifs à semiconducteurs - Essais mécaniques et climatiques.

Publication Date:
2002-11-28 /Anulada
Cancellation date:
2005-10-01
ICS:

31.080.01 / Semiconductor devices in general

CTN:

CTN 209/SC 47 - Semiconductor devices

International equivalences:

EN 60749:1999/A2:2001 (Identical)

IEC 60749:1996/A2:2001 (Identical)

Cancellations:

It is cancelled by: UNE-EN 60749-10:2003

It is cancelled by: UNE-EN 60749-11:2003

It is cancelled by: UNE-EN 60749-1:2004

It is cancelled by: UNE-EN 60749-12:2003

It is cancelled by: UNE-EN 60749-13:2003

It is cancelled by: UNE-EN 60749-2:2003

It is cancelled by: UNE-EN 60749-3:2003

It is cancelled by: UNE-EN 60749-4:2003

It is cancelled by: UNE-EN 60749-6:2003

It is cancelled by: UNE-EN 60749-7:2003

It is cancelled by: UNE-EN 60749-9:2003

Modifications:

Modifies: UNE-EN 60749/A1:2001

Modifies: UNE-EN 60749:2000