Dispositivos semiconductores. Ensayos mecánicos y climáticos.
Semiconductor devices - Mechanical and climatic test methods
Dispositifs à semiconducteurs - Essais mécaniques et climatiques
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31.080.01 / Semiconductor devices in general
CTN 209/SC 47 - Semiconductor devices
EN 60749:1999 (Identical)
IEC 60749:1996 (Identical)
It is cancelled by: UNE-EN 60749-10:2003
It is cancelled by: UNE-EN 60749-11:2003
It is cancelled by: UNE-EN 60749-1:2004
It is cancelled by: UNE-EN 60749-12:2003
It is cancelled by: UNE-EN 60749-13:2003
It is cancelled by: UNE-EN 60749-2:2003
It is cancelled by: UNE-EN 60749-3:2003
It is cancelled by: UNE-EN 60749-4:2003
It is cancelled by: UNE-EN 60749-6:2003
It is cancelled by: UNE-EN 60749-7:2003
It is cancelled by: UNE-EN 60749-9:2003
Cancel: UNE 20699:1992
Modified by: UNE-EN 60749/A1:2001
Modified by: UNE-EN 60749/A2:2002
