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UNE-EN 60749-3:2003
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UNE-EN 60749-3:2003

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 3: Examen visual externo.

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 3: Examen visuel externe

Publication Date:
2003-05-30 /Anulada
Cancellation date:
2020-04-08
ICS:

31.080.01 / Semiconductor devices in general

CTN:

CTN 209/SC 47 - Semiconductor devices

International equivalences:

EN 60749-3:2002 (Identical)

IEC 60749-3:2002 (Identical)

Cancellations:

It is cancelled by: UNE-EN 60749-3:2017 (Ratificada)

Cancel: UNE-EN 60749/A1:2001

Cancel: UNE-EN 60749/A2:2002

Cancel: UNE-EN 60749:2000