IEC 62007-2:1997+AMD1:1998 CSV

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 2: Méthodes de mesure

Date:

2009-01-26 /Anulada

Summary (English):

Describes the measuring methods applicable to the semiconductor devices to be used in the field of fibre optic systems and subsystems. This consolidated version consists of the first edition (1997) and its amendment 1 (1998). Therefore, no need to order amendment in addition to this publication.

Summary (French):

Relaciones con otras normas IEC

Es anulada por: IEC 62007-2:2009

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