IEC 62007-2:2009

Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 2: Méthodes de mesure

Date:

2009-01-26 /Vigente

Summary (English):

IEC 62007-2:2009 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic digital communication systems and subsystems. This edition includes the following significant technical changes with respect to the previous edition: - descriptions related to analogue characteristics have been removed; - some definitions and terms have been revised for harmonisation with other standards originating from SC 86C.

Summary (French):

Relaciones con otras normas IEC

Anula a: IEC 62007-2:1997/AMD1:1998
Anula a: IEC 62007-2:1997+AMD1:1998 CSV
Anula a: IEC 62007-2:1997

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