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IEC 60749:1996

IEC 60749:1996

Semiconductor devices - Mechanical and climatic test methods

Dispositifs à semiconducteurs - Essais mécaniques et climatiques

Date:
2004-05-21 /Anulada
Summary (English):
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Summary (French):
Relaciones con otras normas IEC

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