Skip main navigation
Standard
IEC 60749:1984/AMD1:1991

IEC 60749:1984/AMD1:1991

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.

Amendement 1 - Dispositifs à semiconducteurs - Essais mécaniques et climatiques .

Date:
1996-10-28 /Anulada
Summary (English):
Summary (French):
Relaciones con otras normas IEC

Buy on AENOR

This standard is available in:

Digital format

Bilingue