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IEC 60749-8:2002/COR2:2003

IEC 60749-8:2002/COR2:2003

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Corrigendum 2 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 8: Etanchéité

Date:
2003-08-12 /Vigente
Summary (English):
Modification of the validity date: now put at 2007.
Summary (French):
Relaciones con otras normas IEC

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