Home>Encuentra tu norma>Busca tu norma>IEC
Standard
IEC 60749:1984

IEC 60749:1984

Semiconductor devices - Mechanical and climatic test methods.

Dispositifs à semiconducteurs - Essais mécaniques et climatiques .

Date:
1996-10-28 /Anulada
Summary (English):
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Summary (French):
Relaciones con otras normas IEC

Buy on AENOR

This standard is available in:

Digital format

Ingles / Bilingue