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Number of results 120
UNE-EN IEC 62276:2025 UNE
Status: Vigente/ 2025-06-01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in June of 2025.)
UNE-EN IEC 62604-2:2022 UNE
Status: Vigente/ 2022-11-01
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (Endorsed by Asociación Española de Normalización in November of 2022.)
UNE-EN IEC 62604-1:2022 UNE
Status: Vigente/ 2022-10-01
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in October of 2022.)
UNE-EN IEC 63041-1:2021 UNE
Status: Vigente/ 2021-12-01
Piezoelectric sensors - Part 1: Generic specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
UNE-EN IEC 60444-6:2021 UNE
Status: Vigente/ 2021-11-01
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by Asociación Española de Normalización in November of 2021.)
UNE-EN IEC 61837-2:2018/A1:2020 UNE
Status: Vigente/ 2021-01-01
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by Asociación Española de Normalización in January of 2021.)
UNE-EN IEC 63041-3:2020 UNE
Status: Vigente/ 2020-11-01
Piezoelectric sensors - Part 3: Physical sensors (Endorsed by Asociación Española de Normalización in November of 2020.)
UNE-EN IEC 63155:2020 UNE
Status: Vigente/ 2020-07-01
Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications (Endorsed by Asociación Española de Normalización in July of 2020.)
UNE-EN IEC 62884-4:2019 UNE
Status: Vigente/ 2019-08-01
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (Endorsed by Asociación Española de Normalización in August of 2019.)
UNE-EN IEC 60122-4:2019 UNE
Status: Vigente/ 2019-05-01
Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)
UNE-EN IEC 61837-2:2018 UNE
Status: Vigente/ 2018-08-01
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures (Endorsed by Asociación Española de Normalización in August of 2018.)
UNE-EN IEC 62884-3:2018 UNE
Status: Vigente/ 2018-06-01
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN 60122-1:2002/A1:2018 UNE
Status: Vigente/ 2018-05-01
Quartz crystal units of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in May of 2018.)
UNE-EN IEC 63041-2:2018 UNE
Status: Vigente/ 2018-04-01
Piezoelectric Sensors - Part 2: Chemical and Biochemical Sensors (Endorsed by Asociación Española de Normalización in April of 2018.)
UNE-EN IEC 62604-2:2018 UNE
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use (Endorsed by Asociación Española de Normalización in April of 2018.)
UNE-EN 62884-2:2017 UNE
Status: Vigente/ 2018-01-01
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (Endorsed by Asociación Española de Normalización in January of 2018.)
UNE-EN 60679-1:2017 UNE
Status: Vigente/ 2017-12-01
Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in December of 2017.)
UNE-EN 62884-1:2017 UNE
Status: Vigente/ 2017-11-01
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (Endorsed by Asociación Española de Normalización in November of 2017.)
UNE-EN 60444-8:2017 UNE
Status: Vigente/ 2017-05-01
Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
UNE-EN 61240:2017 UNE
Status: Vigente/ 2017-03-01
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (Endorsed by Asociación Española de Normalización in March of 2017.)
UNE-EN 62276:2016 UNE
Status: Vigente/ 2017-01-01
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)
UNE-EN 60758:2016 UNE
Status: Vigente/ 2016-11-01
Synthetic Quartz Crystal - Specifications and guidelines for use (Endorsed by AENOR in November of 2016.)
UNE-EN 62575-1:2016 UNE
Status: Vigente/ 2016-04-01
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in April of 2016.)
UNE-EN 61837-3:2015 UNE
Status: Vigente/ 2016-01-01
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures (Endorsed by AENOR in January of 2016.)
UNE-EN 60862-1:2015 UNE
Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification (Endorsed by AENOR in January of 2016.)
UNE-EN 61338-1-5:2015 UNE
Status: Vigente/ 2015-10-01
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (Endorsed by AENOR in October of 2015.)
UNE-EN 62604-1:2015 UNE
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (Endorsed by AENOR in October of 2015.)
UNE-EN 61837-4:2015 UNE
Status: Vigente/ 2015-06-01
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines (Endorsed by AENOR in June of 2015.)
UNE 21302-561:1992 UNE
Status: Current/2015-01-23
ELECTROTECHNICAL VOCABULARY. PIEZOELECTRIC DEVICES FOR FREQUENCY CONTROL AND SELECTION.
UNE 21302-561/1M:2001 UNE
Electrotechnical vocabulary. Chapter 561: Piezoelectric devices for frequency control and selection.
UNE-EN 62761:2014 UNE
Status: Vigente/ 2014-07-01
Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) (Endorsed by AENOR in July of 2014.)
UNE-EN 60679-3:2013 UNE
Status: Vigente/ 2013-08-01
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (Endorsed by AENOR in August of 2013.)
UNE-EN 62575-2:2012 UNE
Status: Vigente/ 2012-11-01
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in November of 2012.)
UNE-EN 61837-1:2012 UNE
Status: Vigente/ 2012-10-01
Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines (Endorsed by AENOR in October of 2012.)
UNE-EN 60862-2:2012 UNE
Status: Vigente/ 2012-09-01
Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use (Endorsed by AENOR in September of 2012.)
UNE-EN 60122-3:2010 UNE
Status: Vigente/ 2011-04-01
Quartz crystal units of assessed quality -- Part 3: Standard outlines and lead connections (Endorsed by AENOR in April of 2011.)
UNE-EN 60368-3:2010 UNE
Status: Vigente/ 2011-03-01
Piezoelectric filters of assessed quality -- Part 3: Standard outlines and lead connections (Endorsed by AENOR in March of 2011.)
UNE-EN 60444-11:2010 UNE
Status: Vigente/ 2011-02-01
Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (Endorsed by AENOR in February of 2011.)
UNE-EN 60689:2009 UNE
Status: Vigente/ 2009-06-01
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (Endorsed by AENOR in June of 2009.)
UNE-EN 60444-9:2007 UNE
Status: Vigente/ 2007-08-01
Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007). (Endorsed by AENOR in August of 2007.)
UNE-EN 61337-1:2004 UNE
Status: Vigente/ 2006-09-01
Filters using waveguide type dielectric resonators -- Part 1: Generic specification (IEC 61337-1:2004). (Endorsed by AENOR in September of 2006.)
UNE-EN 61019-2:2005 UNE
Status: Vigente/ 2005-09-01
Surface acoustic wave (SAW) resonators -- Part 2: Guide to the use (Endorsed by AENOR in September of 2005.)
UNE-EN 61338-4:2005 UNE
Waveguide type dielectric resonators -- Part 4: Sectional specification (Endorsed by AENOR in September of 2005.)
UNE-EN 61338-4-1:2005 UNE
Waveguide type dielectric resonators -- Part 4-1: Blank detail specification (Endorsed by AENOR in September of 2005.)
UNE-EN 61019-1:2005 UNE
Status: Vigente/ 2005-04-01
Surface acoustic wave (SAW) resonators of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in April of 2005.)
UNE-EN 60862-3:2005 UNE
Status: Vigente/ 2005-03-30
Surface acoustic wave (SAW) filters of assessed quality -- Part 3: Standard outlines
UNE-EN 61337-2:2004 UNE
Status: Vigente/ 2005-01-01
Filters using waveguide type dielectric resonators -- Part 2: Guidance for use (Endorsed by AENOR in January of 2005.)
UNE-EN 60368-1:2000/A1:2004 UNE
Status: Vigente/ 2004-11-01
Piezoelectric filters of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in November of 2004.)
UNE-EN 60444-7:2004 UNE
Status: Vigente/ 2004-09-01
Measurement of queartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units (Endorsed by AENOR in September of 2004.)
UNE-EN 60122-1:2002 UNE
Status: Vigente/ 2003-03-01
Quartz crystal units of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in March of 2003.)
