Committee

Committee:

CTN 209/SC 47 - Semiconductor devices

Secretary:
UNE - ASOCIACIÓN ESPAÑOLA DE NORMALIZACIÓN
International Relations:

IEC/TC 47  Semiconductor devices

CLC/TC 47X  Semiconductors and Trusted Chips Implementation

Standards developed by the committee: CTN 209/SC 47: 299

UNE-EN 60749-19:2003

Status: VIGENTE /  2003-11-21

Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength

UNE-EN 60191-6-2:2003

Status: VIGENTE /  2003-10-10

Mechanical standardization of semiconductor devices -- Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages

UNE-EN 60191-6-4:2003 (Ratificada)

Status: VIGENTE /  2003-10-01

Mechanical standardization of semiconductor devices -- Part 6-4: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of ball grid array (BGA) (Endorsed by AENOR in October of 2003.)

UNE-EN 61967-5:2003 (Ratificada)

Status: VIGENTE /  2003-07-01

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method (Endorsed by AENOR in July of 2003.)

UNE-EN 60749-11:2003

Status: VIGENTE /  2003-05-30

Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.

UNE-EN 60749-2:2003

Status: VIGENTE /  2003-05-30

Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

UNE-EN 60747-16-3:2002 (Ratificada)

Status: VIGENTE /  2002-12-01

Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters. (Endorsed by AENOR in December of 2002.)

UNE-EN 61967-6:2002 (Ratificada)

Status: VIGENTE /  2002-11-01

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)

UNE-EN 60747-16-1:2002 (Ratificada)

Status: VIGENTE /  2002-07-01

Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by AENOR in July of 2002.)

UNE-EN 60191-6-1:2002

Status: VIGENTE /  2002-06-28

Mechanical standardization of semiconductor devices -- Part 6-1: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for gull-wing lead terminals.

UNE-EN 60191-6-5:2002

Status: VIGENTE /  2002-06-28

Mechanical standardization of semiconductor devices -- Part 6-5: General rules for the preparation of outline drawings of surface mounted semiconductor device package - Design guide for fine -pitch ball grid array (FBGA).

UNE-EN 60191-6-8:2002

Status: VIGENTE /  2002-06-28

Mechanical standardization of semiconductor devices -- Part 6-8: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for glass sealed ceramic quad flatpack (G-QFP).

UNE-EN 60191-6-6:2002

Status: VIGENTE /  2002-03-21

Mechanical standardization of semiconductor devices -- Part 6-6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine pitch land grid array (FLGA).

UNE-EN 60191-6-3:2000 (Ratificada)

Status: VIGENTE /  2001-12-01

Mechanical standardization of semiconductor devices -- Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP) (Endorsed by AENOR in December of 2001.)

UNE-EN 61964:1999 (Ratificada)

Status: VIGENTE /  2001-04-01

Integrated circuits - Memory devices pin configurations. (Endorsed by AENOR in April of 2001.)

UNE-EN 60191-3:2001

Status: VIGENTE /  2001-01-31

Mechanical standardization of semiconductor devices -- Part 3: General rules for the preparation of outline drawings of integrated circuits.

UNE-EN 61943:1999 (Ratificada)

Status: VIGENTE /  1999-11-01

INTEGRATED CIRCUITS. MANUFACTURING LINE APPROVAL APPLICATION GUIDELINE (Endorsed by AENOR in November of 1999.)

UNE-EN 61747-5:1998 (Ratificada)

Status: VIGENTE /  1998-11-01

LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES. PART 5: ENVIRONMENTAL, ENDURANCE AND MECHANICAL TEST METHODS (Endorsed by AENOR in November of 1998.)

UNE-EN 60821:1994 (Ratificada)

Status: VIGENTE /  1997-11-01

IEC 821 VMEBUS. MICROPROCESSOR SYSTEM BUS FOR 1 BYTE TO 4 BYTE DATA. (Endorsed by AENOR in November of 1997.)

UNE-EN 120008:1993 (Ratificada)

Status: VIGENTE /  1996-09-01

BDS: LIGHT EMITTING DIODES AND INFRARED EMITTING DIODES FOR FIBRE OPTIC SYSTEM OR SUB-SYSTEM. (Endorsed by AENOR in September of 1996.)

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