Committee

Committee:

CTN 209/SC 47 - Semiconductor devices

Secretary:
UNE - ASOCIACIÓN ESPAÑOLA DE NORMALIZACIÓN
International Relations:

IEC/TC 47  Semiconductor devices

CLC/TC 47X  Semiconductors and Trusted Chips Implementation

Standards developed by the committee: CTN 209/SC 47: 299

UNE-EN IEC 61967-4:2021 (Ratificada)

Status: VIGENTE /  2021-06-01

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method

UNE-EN IEC 62435-7:2021 (Ratificada)

Status: VIGENTE /  2021-04-01

Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices (Endorsed by Asociación Española de Normalización in April of 2021.)

UNE-EN IEC 60747-17:2020/AC:2021-02 (Ratificada)

Status: VIGENTE /  2021-03-01

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)

UNE-EN IEC 60747-17:2020 (Ratificada)

Status: VIGENTE /  2021-01-01

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in January of 2021.)

UNE-EN IEC 62433-6:2020 (Ratificada)

Status: VIGENTE /  2021-01-01

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) (Endorsed by Asociación Española de Normalización in January of 2021.)

UNE-EN IEC 60749-20:2020 (Ratificada)

Status: VIGENTE /  2020-11-01

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (Endorsed by Asociación Española de Normalización in November of 2020.)

UNE-EN IEC 60749-15:2020 (Ratificada)

Status: VIGENTE /  2020-11-01

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.)

UNE-EN IEC 60749-30:2020 (Ratificada)

Status: VIGENTE /  2020-11-01

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)

UNE-EN IEC 62435-8:2020 (Ratificada)

Status: VIGENTE /  2020-10-01

Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices (Endorsed by Asociación Española de Normalización in October of 2020.)

UNE-EN IEC 60749-41:2020 (Ratificada)

Status: VIGENTE /  2020-10-01

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)

UNE-EN 60747-16-5:2013/A1:2020 (Ratificada)

Status: VIGENTE /  2020-10-01

Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)

UNE-EN IEC 60747-5-5:2020 (Ratificada)

Status: VIGENTE /  2020-10-01

Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)

UNE-EN IEC 62433-1:2019/AC:2020-07 (Ratificada)

Status: VIGENTE /  2020-09-01

EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in September of 2020.)

UNE-EN IEC 62435-3:2020 (Ratificada)

Status: VIGENTE /  2020-06-01

Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (Endorsed by Asociación Española de Normalización in June of 2020.)

UNE-EN IEC 60747-16-6:2019 (Ratificada)

Status: VIGENTE /  2019-10-01

Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)

UNE-EN IEC 60749-18:2019 (Ratificada)

Status: VIGENTE /  2019-07-01

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Española de Normalización in July of 2019.)

UNE-EN IEC 62228-3:2019 (Ratificada)

Status: VIGENTE /  2019-06-01

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in June of 2019.)

UNE-EN IEC 60749-17:2019 (Ratificada)

Status: VIGENTE /  2019-06-01

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Española de Normalización in June of 2019.)

UNE-EN IEC 62433-1:2019 (Ratificada)

Status: VIGENTE /  2019-06-01

EMC IC modelling - Part 1: General modelling framework (Endorsed by Asociación Española de Normalización in June of 2019.)

UNE-EN IEC 61967-1:2019 (Ratificada)

Status: VIGENTE /  2019-03-01

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in March of 2019.)

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