Committee

Committee:

CTN 209/SC 47 - Semiconductor devices

Secretary:
UNE - ASOCIACIÓN ESPAÑOLA DE NORMALIZACIÓN
International Relations:

IEC/TC 47  Semiconductor devices

CLC/TC 47X  Semiconductors and Trusted Chips Implementation

Standards developed by the committee: CTN 209/SC 47: 299

UNE-EN IEC 60747-15:2024 (Ratificada)

Status: VIGENTE /  2025-01-01

Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (Endorsed by Asociación Española de Normalización in January of 2025.)

UNE-EN IEC 60747-16-9:2024 (Ratificada)

Status: VIGENTE /  2024-12-01

Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (Endorsed by Asociación Española de Normalización in December of 2024.)

UNE-EN IEC 60749-5:2024 (Ratificada)

Status: VIGENTE /  2024-03-01

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)

UNE-EN IEC 62228-3:2019/AC:2023-07 (Ratificada)

Status: VIGENTE /  2023-08-01

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in August of 2023.)

UNE-EN IEC 61967-8:2023 (Ratificada)

Status: VIGENTE /  2023-07-01

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)

UNE-EN IEC 63287-2:2023 (Ratificada)

Status: VIGENTE /  2023-06-01

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)

UNE-EN IEC 63364-1:2023 (Ratificada)

Status: VIGENTE /  2023-03-01

Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)

UNE-EN IEC 60747-16-7:2023 (Ratificada)

Status: VIGENTE /  2023-02-01

Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)

UNE-EN IEC 60747-16-8:2023 (Ratificada)

Status: VIGENTE /  2023-02-01

Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)

UNE-EN IEC 62228-6:2022 (Ratificada)

Status: VIGENTE /  2023-01-01

Integrated circuit - EMC Evaluation of transceivers - Part 6: PSI5 transceivers (Endorsed by Asociación Española de Normalización in January of 2023.)

UNE-EN IEC 60749-37:2022 (Ratificada)

Status: VIGENTE /  2023-01-01

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)

UNE-EN IEC 60749-10:2022 (Ratificada)

Status: VIGENTE /  2022-07-01

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)

UNE-EN IEC 62228-7:2022 (Ratificada)

Status: VIGENTE /  2022-05-01

Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers (Endorsed by Asociación Española de Normalización in May of 2022.)

UNE-EN IEC 63373:2022 (Ratificada)

Status: VIGENTE /  2022-05-01

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (Endorsed by Asociación Española de Normalización in May of 2022.)

UNE-EN IEC 60749-28:2022 (Ratificada)

Status: VIGENTE /  2022-05-01

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)

UNE-EN IEC 60749-39:2022 (Ratificada)

Status: VIGENTE /  2022-03-01

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)

UNE-EN IEC 63244-1:2021 (Ratificada)

Status: VIGENTE /  2021-12-01

Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications (Endorsed by Asociación Española de Normalización in December of 2021.)

UNE-EN IEC 62435-9:2021 (Ratificada)

Status: VIGENTE /  2021-11-01

Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special Cases (Endorsed by Asociación Española de Normalización in November of 2021.)

UNE-EN IEC 63287-1:2021 (Ratificada)

Status: VIGENTE /  2021-11-01

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)

UNE-EN IEC 62228-5:2021 (Ratificada)

Status: VIGENTE /  2021-07-01

Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (Endorsed by Asociación Española de Normalización in July of 2021.)

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