Committee:
IEC/TC 47 Semiconductor devices
CLC/TC 47X Semiconductors and Trusted Chips Implementation
Standards developed by the committee: CTN 209/SC 47: 299
Status: ANULADA / 2023-10-06
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
Status: ANULADA / 2023-10-05
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Status: ANULADA / 2023-09-28
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification
Family Specification: AC MOS Digital integrated circuits
Family Specification: TTL advanced Schottky digital integrated circuits - Series 54AS, 74AS
Family Specification: Digital integrated HC MOS circuits - Series HC/HCT/HCU
Family Specification: TTL FAST digital integrated circuits - Series 54F, 74F
Family Specification: Digital integrated TTL circuits - Series 54, 64, 74, 84
Family Specification: TTL advanced low power Schottky digital integrated circuits - Series 54ALS, 74ALS
Family Specification: Digital integrated TTL low power Schottky circuits - Series 54LS, 64LS, 74LS, 84LS
Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
Generic Specification: Monolithic integrated circuits
Sectional Specification: Film and hybrid integrated circuits
Sectional Specification: Digital monolithic integrated circuits
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