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Number of results 2.598
UNE-EN IEC 60601-2-33:2024 UNE
Status: Current/ 2024-11-01
Medical electrical equipment - Part 2-33: Particular requirements for the basic safety and essential performance of magnetic resonance equipment for medical diagnosis (Endorsed by Asociación Española de Normalización in November of 2024.)
UNE-EN IEC 60601-2-75:2019/A1:2024 UNE
Medical electrical equipment - Part 2-75: Particular requirements for the basic safety and essential performance of photodynamic therapy and photodynamic diagnosis equipment (Endorsed by Asociación Española de Normalización in November of 2024.)
UNE-EN IEC 60352-9:2024 UNE
Status: Vigente/ 2024-05-01
Solderless connections - Part 9: Ultrasonically welded connections - General requirements, test methods and practical guidance (Endorsed by Asociación Española de Normalización in May of 2024.)
UNE-EN IEC 63305:2024 UNE
Underwater Acoustics - Calibration of acoustic wave vector receivers in the frequency range 5 Hz to 10 kHz (Endorsed by Asociación Española de Normalización in May of 2024.)
UNE-EN IEC 60939-3:2024 UNE
Passive filter units for electromagnetic interference suppression - Part 3: Passive filter units for which safety tests are appropriate (Endorsed by Asociación Española de Normalización in May of 2024.)
UNE-EN IEC 80601-2-26:2020/A1:2024 UNE
Medical electrical equipment - Part 2-26: Particular requirements for the basic safety and essential performance of electroencephalographs (Endorsed by Asociación Española de Normalización in May of 2024.)
UNE-EN 175201-804:1999 UNE
Status: Vigente/ 2024-02-15
Detail Specification: Circular connectors - Round contacts, size diameter 1,6 mm, threaded coupling (Endorsed by AENOR in June of 2000.)
UNE-EN 175300:1997 UNE
SECTIONAL SPECIFICATION: RECTANGULAR CONNECTORS FOR FREQUENCIES BELOW 3 MHZ.
UNE-EN 175101-802:1999 UNE
Detail specification: Two-part connectors for printed boards for high number of contacts with basic grid of 2,54 mm on 3 or 4 rows (Endorsed by AENOR in June of 2000.)
UNE-EN 140200:1996 UNE
Status: Vigente/ 2021-09-22
BLANK DETAIL SPECIFICATION: FIXED POWER RESISTORS (Endorsed by AENOR in July of 1998.)
UNE-EN 140201:1996 UNE
BLANK DETAIL SPECIFICATION: FIXED POWER RESISTORS (ASSESSMENT LEVEL S) (Endorsed by AENOR in July of 1998.)
UNE-EN 140200:1996/A1:2001 UNE
Status: Vigente/ 2016-11-08
Sectional Specification: Fixed power resistors (Endorsed by AENOR in December of 2001.)
UNE-EN 60191-6-2:2003 UNE
Status: Vigente/ 2003-10-10
Mechanical standardization of semiconductor devices -- Part 6-2: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for 1,50 mm, 1,27 mm and 1,00 mm pitch ball and column terminal packages
UNE-EN 60191-6-4:2003 UNE
Status: Vigente/ 2003-10-01
Mechanical standardization of semiconductor devices -- Part 6-4: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of ball grid array (BGA) (Endorsed by AENOR in October of 2003.)
UNE-EN 61676:2003 UNE
Status: Vigente/ 2003-07-30
Medical electrical equipment - Dosimetric instruments used for non-invasive measurement of X-ray tube voltage in diagnostic radiology
UNE-EN 61076-2-102:2003 UNE
Status: Vigente/ 2003-06-20
Connectors for electronic equipment -- Part 2-102: Circular connectors with assessed quality - Detail specification for plugs and jacks for external low voltage power supply
UNE-EN 61076-4-113:2003 UNE
Status: Vigente/ 2003-06-01
Connectors for electronic equipment - Printed board connectors - Part 4-113: Detail specification for two-part connectors having 5 rows with a grid of 2,54 mm for printed boards and backplanes in bus applications (Endorsed by AENOR in June of 2003.)
UNE-EN 60749-11:2003 UNE
Status: Vigente/ 2003-05-30
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
UNE-EN 60749-2:2003 UNE
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
UNE-EN 60512-25-2:2003 UNE
Connectors for electronic equipment - Tests and measurements -- Part 25-2: Test 25b: Attenuation (insertion loss).
UNE-EN 60512-11-12:2003 UNE
Status: Vigente/ 2003-04-25
Connectors for electronic equipment - Tests and measurements -- Part 11-12: Climatic tests - Test 11m: Damp heat, cyclic.
UNE-EN 60512-11-13:2003 UNE
Connectors for electronic equipment - Tests and measurement -- Part 11-13: Climatic tests - Test 11n: Gas tightness, solderless wrapped connections.
UNE-EN 60512-11-10:2003 UNE
Connectors for electronic equipment - Tests and measurements -- Part 11-10: Climatic tests - Test 11j: Cold.
UNE-EN 60122-1:2002 UNE
Status: Vigente/ 2003-03-01
Quartz crystal units of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in March of 2003.)
UNE-EN 61847:2003 ERRATUM UNE
Status: Vigente/ 2003-02-21
Ultrasonics - Surgical systems - Measurement and declaration of the basic output characteristics.
UNE-EN 61523-2:2002 UNE
Status: Vigente/ 2003-01-01
Delay and power calculation standards -- Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (Endorsed by AENOR in January of 2003.)
UNE-EN 60512-1-1:2002 UNE
Status: Vigente/ 2002-12-16
Connectors for electronic equipment - Tests and measurements - Part 1-1: General examination - Test 1a: Visual examination.
UNE-EN 60512-1-2:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 1-2: General examination - Test 1b: Examination of dimension and mass.
UNE-EN 60512-2-1:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 2-1: Electrical continuity and contact resistance tests - Test 2a: Contact resistance - Millivolt level method.
UNE-EN 60512-6-1:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 6-1: Dynamic stress tests - Test 6a: Acceleration, steady state.
UNE-EN 60512-6-2:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 6-2: Dynamic stress tests - Test 6b: Bump.
UNE-EN 60512-6-3:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 6-3: Dynamic stress tests - Test 6c: Shock.
UNE-EN 60512-6-4:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 6-4: Dynamic stress tests - Test 6d: Vibration (sinusoidal).
UNE-EN 60512-11-2:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 11-2: Climatic tests - Test 11b: Combined/sequential cold, low air pressure and damp heat.
UNE-EN 60512-11-3:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 11-3: Climatic tests - Test 11c: Damp heat, steady state.
UNE-EN 60512-11-4:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 11-4: Climatic tests - Test 11d: Rapid change of temperature.
UNE-EN 60512-11-5:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 11-5: Climatic tests - Test 11e: Mould growth.
UNE-EN 60512-2-3:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 2-3: Electrical continuity and contact resistance tests - Test 2c: Contact resistance variation.
UNE-EN 60512-2-6:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 2-6: Electrical continuity and contact resistance tests - Test 2f: Housing (shell) electrical continuity.
UNE-EN 60512-3-1:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 3-1: Insulation tests - Test 3a: Insulation resistance.
UNE-EN 60512-4-2:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 4-2: Voltage stress tests - Test 4b: Partial discharge.
UNE-EN 60512-4-3:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 4-3: Voltage stress tests - Test 4c: Voltage proof of pre-insulated crimp barrels.
UNE-EN 60512-5-1:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 5-1: Current-carrying capacity tests - Test 5a: Temperature rise.
UNE-EN 60512-5-2:2002 UNE
Connectors for electronic equipment - Tests and measurements -- Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating.
UNE-EN 60747-16-3:2002 UNE
Status: Vigente/ 2002-12-01
Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters. (Endorsed by AENOR in December of 2002.)
UNE-EN 61076-4-108:2002 UNE
Status: Vigente/ 2002-11-01
Connectors for electronic equipment -- Part 4-108: Printed board connectors with assessed quality - Detail specification for cable-to-board connectors, with a modular pitch of 25 mm and integrated shielding function, applicable for transverse packing density of 15 mm, having a basic grid of 2,5 mm in accordance with IEC 60917-1 (Endorsed by AENOR in November of 2002.)
UNE-EN 61076-4-110:2002 UNE
Connectors for electronic equipment -- Part 4-110: Printed board connectors with assessed quality - Detail specification for latched cable connector system having a basic grid of 2,0 mm including full shielding and latching function (Endorsed by AENOR in November of 2002.)
UNE-EN 61967-6:2002 UNE
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
UNE-EN 60512-25-1:2002 UNE
Status: Vigente/ 2002-09-30
Connectors for electronic equipment - Tests and measurements -- Part 25-1: Test 25a - Crosstalk ratio.
UNE-EN 60512-25-3:2002 UNE
Connectors for electronic equipment - Tests and measurement -- Part 25-3: Test 25c - Rise time degradation.
Number of results 2598
