Cribado de fiabilidad mediante esfuerzos. Parte 2: Componente electrónicos.
Reliability stress screening - Part 2: Electronic components
Déverminage sous contraintes - Partie 2: Composants électroniques
Buy on AENOR
See part of the content of the standard
03.120.01 / Quality in general
31.020 / Electronic components in general
CTN 200/SC 56 - Dependability
IEC 61163-2:1998 (Identical)
It is cancelled by: UNE-EN 61163-1:2006 (Ratificada)
