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IEC 60749-4:2002/COR1:2003

IEC 60749-4:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 4: Essai continu fortement accéléré de contrainte de chaleur humide (HAST)

Date:
2017-03-03 /Anulada
Summary (English):
Modification of the validity date: now put at 2007.
Summary (French):
Relaciones con otras normas IEC

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