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IEC 60749-13:2002

IEC 60749-13:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 13 : Atmosphère saline

Date:
2018-02-15 /Anulada
Summary (English):
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.
Summary (French):
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