IEC 62416:2010

Semiconductor devices - Hot carrier test on MOS transistors

Dispositifs à semiconducteurs - Essai de porteur chaud sur les transistors MOS

Date:

2010-04-26 /Vigente

Summary (English):

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Summary (French):

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