IEC 61580-9:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

Méthodes de mesure applicables aux guides d'ondes - Partie 9: Coefficient de réflexion aux interfaces des guides d'ondes

Date:

1996-07-03 /Vigente

Summary (English):

Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

Summary (French):

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