IEC 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 17: Irradiation aux neutrons

Date:

2019-03-28 /Anulada

Summary (English):

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Summary (French):

Relaciones con otras normas IEC

Es anulada por: IEC 60749-17:2019

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