IEC 60749-1:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 1: Généralités

Date:

2002-08-30 /Vigente

Summary (English):

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.

Summary (French):

Relaciones con otras normas IEC

Es modificada por: IEC 60749-1:2002/COR1:2003

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