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IEC 60512-25-3:2001

IEC 60512-25-3:2001

Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation

Connecteurs pour équipements électroniques - Essais et mesures - Partie 25-3: Essai 25c - Dégradation du temps de montée

Date:
2001-07-26 /Vigente
Summary (English):
Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.
Summary (French):

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