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IEC PAS 62336:2002

IEC PAS 62336:2002

Accelerated Moisture Resistance - Unbiased HAST

Date:
2004-03-09 /Anulada
Summary (English):
Used to identify failure mechanisms internal to packages, the unbiased HAST aims at evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Summary (French):
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