Committee:
IEC/TC 47 Semiconductor devices
CLC/TC 47X Semiconductors and Trusted Chips Implementation
Standards developed by the committee: CTN 209/SC 47: 299
Status: VIGENTE / 2018-12-01
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or Finished Devices (Endorsed by Asociación Española de Normalización in December of 2018.)
Status: VIGENTE / 2018-10-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
Status: VIGENTE / 2018-09-01
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (Endorsed by Asociación Española de Normalización in September of 2018.)
Status: VIGENTE / 2018-08-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
Status: VIGENTE / 2018-07-01
Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in July of 2018.)
Status: VIGENTE / 2018-06-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (Endorsed by Asociación Española de Normalización in June of 2018.)
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by Asociación Española de Normalización in June of 2018.)
Status: VIGENTE / 2018-05-01
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
Status: VIGENTE / 2018-04-01
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
Status: VIGENTE / 2018-03-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in March of 2018.)
Status: VIGENTE / 2018-01-01
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by Asociación Española de Normalización in January of 2018.)
Status: VIGENTE / 2017-12-01
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (Endorsed by Asociación Española de Normalización in December of 2017.)
Status: VIGENTE / 2017-08-01
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
Status: VIGENTE / 2017-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by Asociación Española de Normalización in July of 2017.)
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