Committee

Committee:

CTN 209/SC 47 - Semiconductor devices

Secretary:
UNE - ASOCIACIÓN ESPAÑOLA DE NORMALIZACIÓN
International Relations:

IEC/TC 47  Semiconductor devices

CLC/TC 47X  Semiconductors and Trusted Chips Implementation

Standards developed by the committee: CTN 209/SC 47: 299

UNE-EN 60191-6-12:2004

Status: ANULADA /  2014-07-13

Mechanical standardization of semiconductor devices -- Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type

UNE-EN 60749-29:2004

Status: ANULADA /  2014-07-10

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test

UNE-EN 62258-2:2005 (Ratificada)

Status: ANULADA /  2014-06-29

Semiconductor die products -- Part 2: Exchange data formats (Endorsed by AENOR in September of 2005.)

UNE-EN 60749-21:2005 (Ratificada)

Status: ANULADA /  2014-05-12

Semiconductor devices - Mechanical and climatic test methods -- Part 21: Solderability (Endorsed by AENOR in August of 2005.)

UNE-EN 150014:1996 (Ratificada)

Status: ANULADA /  2014-02-06

BDS: THYRISTOR DIODE TRANSIENT SUPPRESSOR (Endorsed by AENOR in May of 1996.)

UNE-EN 60747-15:2004 (Ratificada)

Status: ANULADA /  2014-01-21

Discrete semiconductor devices -- Part 15: Isolated power semiconductor devices (Endorsed by AENOR in May of 2004.)

UNE-EN 60749-15:2003

Status: ANULADA /  2013-12-01

Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices

UNE-EN 60749-34:2005

Status: ANULADA /  2013-12-01

Semiconductor devices - Mechanical and climatic test methods -- Part 34: Power cycling

UNE-EN 62374:2007 (Ratificada)

Status: ANULADA /  2013-11-01

Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007). (Endorsed by AENOR in February of 2008.)

UNE-EN 62258-1:2005 (Ratificada)

Status: ANULADA /  2013-10-01

Semiconductor die products -- Part 1: Requirements for procurement and use (Endorsed by AENOR in January of 2006.)

UNE-EN 60191-6:2004 (Ratificada)

Status: ANULADA /  2012-12-01

Mechanical standardization of semiconductor devices -- Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages (Endorsed by AENOR in March of 2005.)

UNE-EN 60749-20:2004

Status: ANULADA /  2012-09-02

Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat

UNE-EN 61747-3-1:1999 (Ratificada)

Status: ANULADA /  2009-10-01

LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES. PART 3-1: LIQUID CRYSTAL DISPLAY (LCD) CELLS - BLANK DETAIL SPECIFICATION (Endorsed by AENOR in November of 1999.)

UNE-EN 61747-3:1999 (Ratificada)

Status: ANULADA /  2009-09-01

LIQUID CRYSTAL AND SOLID STATE DISPLAY DEVICES. PART 3: SECTIONAL SPECIFICATION FOR LIQUID CRYSTAL DISPLAY (LCD) CELLS (Endorsed by AENOR in November of 1999.)

UNE-EN 60749/A2:2002

Status: ANULADA /  2005-10-01

Semiconductor devices - Mechanical and climatic test methods.

UNE-EN 60749:2000

Status: ANULADA /  2005-10-01

Semiconductor devices - Mechanical and climatic test methods

UNE-EN 60749/A1:2001

Status: ANULADA /  2005-10-01

Semiconductor devices - Mechanical and climatic test methods.

UNE 20191-4:1994

Status: ANULADA /  2002-10-01

MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES. PART 4: CODING SYSTEM AND CLASSIFICATION INTO FORMS OF PACKAGE OUTLINES FOR SEMICONDUCTOR DEVICES.

UNE 21321:1974

Status: ANULADA /  1978-06-01

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