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Committee

Committee:

CTN 209/SC 47 - Semiconductor devices

Secretary:
UNE - ASOCIACIÓN ESPAÑOLA DE NORMALIZACIÓN
International Relations:

IEC/TC 47  Semiconductor devices

CLC/TC 47X  Semiconductors and Trusted Chips Implementation

Standards developed by the committee: CTN 209/SC 47: 299

UNE-EN 190110:1994 (Ratificada)

Status: ANULADA2023-09-28

Blank Detail Specification: Digital microprocessor integrated circuits

UNE-EN 163101:1991 (Ratificada)

Status: ANULADA2023-09-28

Blank Detail Specification: Film and hybrid integrated circuits

UNE-EN 60749-30:2005/A1:2011

Status: ANULADA2023-09-22

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

UNE-EN 60749-30:2005

Status: ANULADA2023-09-22

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

UNE-EN 61747-3-1:2006 (Ratificada)

Status: ANULADA2023-09-21

Liquid crystal display devices - Part 3-1: Liquid crystal display (LCD) cells - Blank detail specification

UNE 21559:1994

Status: ANULADA2023-09-21

Binary floating-point arithmetic for microprocessor systems

UNE-EN 61747-3:2006 (Ratificada)

Status: ANULADA2023-09-21

Liquid crystal display devices - Part 3: Liquid crystal display (LCD) cells - Sectional specification

UNE-EN 61747-1:1999/A1:2003 (Ratificada)

Status: ANULADA2023-09-21

Liquid crystal and solid-state display devices - Part 1: Generic specification

UNE-EN 61747-1:1999 (Ratificada)

Status: ANULADA2023-09-21

Liquid crystal and solid-state display devices - Part 1: Generic specification

UNE-EN 61747-2:1999 (Ratificada)

Status: ANULADA2023-09-21

Liquid crystal and solid-state display devices - Part 2: Liquid crystal display modules - Sectional specification

UNE-EN 61988-4:2007

Status: ANULADA2023-09-21

Plasma display panels - Part 4: Climatic and mechanical testing methods

UNE-EN 60747-5-5:2011 (Ratificada)

Status: ANULADA2023-08-25

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

UNE-EN 60747-5-5:2011/A1:2015 (Ratificada)

Status: ANULADA2023-08-25

Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by AENOR in May of 2015.)

UNE-EN 60749-15:2011

Status: ANULADA2023-08-19

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

UNE-EN 150010:1991 (Ratificada)

Status: ANULADA2022-11-24

BDS: AMBIENT-RATED THYRISTORS. (Endorsed by AENOR in November of 1996.)

UNE-EN 150007:1991 (Ratificada)

Status: ANULADA2022-11-24

BDS: CASE-RATED BIPOLAR TRANSISTORS FOR HIGH FREQUENCY AMPLIFICATION. (Endorsed by AENOR in November of 1996.)

UNE-EN 150003:1991 (Ratificada)

Status: ANULADA2022-11-24

BDS: CASE-RATED BIPOLAR TRANSISTORS FOR LOW FREQUENCY AMPLIFICATION. (Endorsed by AENOR in November of 1996.)

UNE-EN 150006:1991 (Ratificada)

Status: ANULADA2022-11-24

BDS: VARIABLE CAPACITANCE DIODES. (Endorsed by AENOR in November of 1996.)

UNE-EN 150001:1991 (Ratificada)

Status: ANULADA2022-11-24

BDS: GENERAL PURPOSE SEMICONDUCTOR DIODES. (Endorsed by AENOR in November of 1996.)

UNE-EN 150013:1991 (Ratificada)

Status: ANULADA2022-11-24

BDS: CURRENT REGULATOR AND CURRENT REFERENCE DIODES. (Endorsed by AENOR in November of 1996.)