Committee:
IEC/TC 47 Semiconductor devices
CLC/TC 47X Semiconductors and Trusted Chips Implementation
Standards developed by the committee: CTN 209/SC 47: 299
Status: VIGENTE / 1996-09-01
BDS: PIN-PHOTODIODES FOR FIBRE OPTIC APPLICATIONS. (Endorsed by AENOR in September of 1996.)
BDS: LIQUID CRISTAL DISPLAYS. MONOCHROME LCDS WITHOUT ELECTRONIC CIRCUIT. (Endorsed by AENOR in September of 1996.)
Status: VIGENTE / 1995-12-01
MICROPROCESSOR SYSTEM BUS. 8 BIT AND 16 BIT DATA (MULTIBUS I). PART 1: FUNCTIONAL DESCRIPTION WITH ELECTRICAL AND TIMING SPECIFICATIONS. (Endorsed by AENOR in December of 1995.)
MICROPROCESSOR SYSTEM BUS. 8 BIT AND 16 BIT DATA (MULTIBUS I). PART 2: MECHANICAL AND PIN DESCRIPTIONS FOR THE SYSTEM BUS CONFIGURATION, WITH EDGE CONNECTORS (DIRECT). (Endorsed by AENOR in December of 1995.)
Status: VIGENTE / 1994-09-23
MICROPOCESSOR SYSTEM BUS I 8-BIT AND 16 BIT DATA. PART 3: MECHANICAL AND PIN DESCRIPTIONS FOR THE EUROCARD CONFIGURATION WITH PIN AND SOCKET (INDIRECT) CONNECTORS.
Status: VIGENTE / 1993-12-29
IEC 822 VSB. PARALLEL SUB-SYSTEM BUS OF THE IEC 821 VMEBUS.
Status: VIGENTE / 1991-09-12
SEMICONDUCTOR DEVICES. PART 11: SECTIONAL SPECIFICATION FOR DISCRETE DEVICES.
Status: VIGENTE / 1978-06-15
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
Status: ANULADA / 2025-06-02
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
Status: ANULADA / 2025-04-06
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in August of 2017.)
Status: ANULADA / 2025-01-04
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
Status: ANULADA / 2024-10-10
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (Endorsed by Asociación Española de Normalización in October of 2017.)
Status: ANULADA / 2024-04-25
Blank Detail Specification: Ambient rated photocouplers with phototransistor output
Blank Detail Specification: Infrared emitting diodes, infrared emitting diode arrays
Blank Detail Specification: Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
Blank Detail Specification: Photodiodes, photodiode arrays (not intended for fibre optic applications)
Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
Status: ANULADA / 2024-04-21
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
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