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Standard
IEC PAS 62276:2001

IEC PAS 62276:2001

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

Date:
2005-05-30 /Anulada
Summary (English):
Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.
Summary (French):
Relaciones con otras normas IEC

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