Committee:
IEC/TC 47 Semiconductor devices
CLC/TC 47X Semiconductors and Trusted Chips Implementation
Standards developed by the committee: CTN 209/SC 47: 299
Status: ANULADA / 2022-11-24
BDS: SINGLE GATE FIELD-EFFECT TRANSISTORS. (Endorsed by AENOR in November of 1996.)
BDS: BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS. (Endorsed by AENOR in November of 1996.)
BDS: AMBIENT-RATED RECTIFIER DIODES. (Endorsed by AENOR in September of 1996.)
BDS: CASE-RATED RECTIFIER DIODES. (Endorsed by AENOR in September of 1996.)
BDS: UNIDIRECTIONAL TRANSIENT OVERVOLTAGE SUPPRESSOR DIODES. (Endorsed by AENOR in September of 1996.)
Status: ANULADA / 2022-09-01
Generic specification: Discrete pressure contact power semiconductor devices (Qualification approval)
Status: ANULADA / 2022-05-16
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Status: ANULADA / 2022-05-03
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Status: ANULADA / 2022-01-17
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Status: ANULADA / 2021-10-28
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
Status: ANULADA / 2021-04-08
BDS: CASE-RATED THYRISTORS. (Endorsed by AENOR in November of 1996.)
Status: ANULADA / 2021-03-23
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Status: ANULADA / 2021-02-28
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
Status: ANULADA / 2021-02-20
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by AENOR in July of 2014.)
Status: ANULADA / 2021-01-18
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Status: ANULADA / 2020-09-03
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
Status: ANULADA / 2020-05-16
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Status: ANULADA / 2020-04-08
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
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