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UNE-EN 61523-2:2002 UNE
Status: Vigente/ 2003-01-01
Delay and power calculation standards -- Part 2: Pre-layout delay calculation specification for CMOS ASIC libraries (Endorsed by AENOR in January of 2003.)
UNE-EN 61691-3-2:2001 UNE
Status: Vigente/ 2002-05-01
Behavioural languages -- Part 3-2: Mathematical operation in VHDL (Endorsed by AENOR in May of 2002.)
UNE-EN 61690-1:2000 UNE
Status: Vigente/ 2000-11-01
Electronic Design Interchange Format (EDIF) - Part 1: Version 3 0 0
UNE-EN 61690-2:2000 UNE
Electronic Design Interchange Format (EDIF) - Part 2: Version 4 0 0
UNE-EN 61926-1:2000 UNE
Design automation -- Part 1: Standard test language for all systems - Common abbreviated test language for all systems (C/ATLAS) (Endorsed by AENOR in November of 2000.)
UNE-EN 61691-1:1997 UNE
Status: Vigente/ 1997-12-01
DESIGN AUTOMATION. PART 1: VHDL LANGUAGE REFERENCE MANUAL. (Endorsed by AENOR in December of 1997.)
UNE-EN 61691-2:2001 UNE
Status: Anulada/ 2023-03-30
Behavioural languages - Part 2: VHDL multilogic system for model interoperability
UNE-EN 61523-1:2002 UNE
Delay and power calculation standards - Part 1: Integrated circuit delay and power calculation systems
UNE-EN 61691-3-3:2001 UNE
Behavioural languages - Part 3-3: Synthesis in VHDL
UNE-EN 62014-1:2002 UNE
Status: Anulada/ 2019-11-28
Electronic design automation libraries - Part 1: Input/Output buffer information specifications (IBIS version 3.2)
UNE-ENV 50208-6:1997 UNE
Status: Anulada/ 2014-02-06
DATA INTERCHANGE FORMAT FOR SIMULATED AND MEASURED DATA (ISMD) (Endorsed by AENOR in December of 1997.)
UNE-ENV 50218:1996 UNE
DESCRIPTION OF PARAMETRIZED EUROPEAN MINI TEST CHIP (Endorsed by AENOR in December of 1997.)
UNE-ENV 50219:1996 UNE
DESCRIPTION OF THE RELIABILITY TEST STRUCTURES OF THE EUROPEAN MINI TEST CHIP (Endorsed by AENOR in December of 1997.)
