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UNE-EN IEC 60747-15:2024 UNE
Status: Current/ 2025-01-01
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices (Endorsed by Asociación Española de Normalización in January of 2025.)
UNE-EN IEC 60747-16-9:2024 UNE
Status: Current/ 2024-12-01
Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (Endorsed by Asociación Española de Normalización in December of 2024.)
UNE-EN IEC 60749-5:2024 UNE
Status: Vigente/ 2024-03-01
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in March of 2024.)
UNE-EN IEC 62228-3:2019/AC:2023-07 UNE
Status: Vigente/ 2023-08-01
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers (Endorsed by Asociación Española de Normalización in August of 2023.)
UNE-EN IEC 61967-8:2023 UNE
Status: Vigente/ 2023-07-01
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by Asociación Española de Normalización in July of 2023.)
UNE-EN IEC 63287-2:2023 UNE
Status: Vigente/ 2023-06-01
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
UNE-EN IEC 63364-1:2023 UNE
Status: Vigente/ 2023-03-01
Semiconductor devices - Semiconductor devices for IOT system - Part 1: Test method of sound variation detection (Endorsed by Asociación Española de Normalización in March of 2023.)
UNE-EN IEC 60747-16-8:2023 UNE
Status: Vigente/ 2023-02-01
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
UNE-EN IEC 60747-16-7:2023 UNE
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)
UNE-EN IEC 60749-37:2022 UNE
Status: Vigente/ 2023-01-01
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (Endorsed by Asociación Española de Normalización in January of 2023.)
UNE-EN IEC 60749-10:2022 UNE
Status: Vigente/ 2022-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly (Endorsed by Asociación Española de Normalización in July of 2022.)
UNE-EN IEC 63373:2022 UNE
Status: Vigente/ 2022-05-01
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices (Endorsed by Asociación Española de Normalización in May of 2022.)
UNE-EN IEC 60749-28:2022 UNE
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
UNE-EN IEC 60749-39:2022 UNE
Status: Vigente/ 2022-03-01
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (Endorsed by Asociación Española de Normalización in March of 2022.)
UNE-EN IEC 63244-1:2021 UNE
Status: Vigente/ 2021-12-01
Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1: General requirements and specifications (Endorsed by Asociación Española de Normalización in December of 2021.)
UNE-EN IEC 63287-1:2021 UNE
Status: Vigente/ 2021-11-01
Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification (Endorsed by Asociación Española de Normalización in November of 2021.)
UNE-EN IEC 62435-9:2021 UNE
Electronic components - Long-term storage of electronic semiconductor devices - Part 9: Special Cases (Endorsed by Asociación Española de Normalización in November of 2021.)
UNE-EN IEC 61967-4:2021 UNE
Status: Vigente/ 2021-06-01
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method
UNE-EN IEC 62435-7:2021 UNE
Status: Vigente/ 2021-04-01
Electronic components - Long-term storage of electronic semiconductor devices - Part 7: Micro-electromechanical devices (Endorsed by Asociación Española de Normalización in April of 2021.)
UNE-EN IEC 60747-17:2020/AC:2021-02 UNE
Status: Vigente/ 2021-03-01
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in March of 2021.)
UNE-EN IEC 60747-17:2020 UNE
Status: Vigente/ 2021-01-01
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation (Endorsed by Asociación Española de Normalización in January of 2021.)
UNE-EN IEC 60749-15:2020 UNE
Status: Vigente/ 2020-11-01
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (Endorsed by Asociación Española de Normalización in November of 2020.)
UNE-EN IEC 60749-30:2020 UNE
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (Endorsed by Asociación Española de Normalización in November of 2020.)
UNE-EN IEC 60749-20:2020 UNE
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (Endorsed by Asociación Española de Normalización in November of 2020.)
UNE-EN IEC 60747-5-5:2020 UNE
Status: Vigente/ 2020-10-01
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN 60747-16-5:2013/A1:2020 UNE
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN IEC 60749-41:2020 UNE
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN IEC 62435-8:2020 UNE
Electronic components - Long-term storage of electronic semiconductor devices - Part 8: Passive electronic devices (Endorsed by Asociación Española de Normalización in October of 2020.)
UNE-EN IEC 62435-3:2020 UNE
Status: Vigente/ 2020-06-01
Electronic components - Long-term storage of electronic semiconductor devices - Part 3: Data (Endorsed by Asociación Española de Normalización in June of 2020.)
UNE-EN IEC 60747-16-6:2019 UNE
Status: Vigente/ 2019-10-01
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
UNE-EN IEC 60749-18:2019 UNE
Status: Vigente/ 2019-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (Endorsed by Asociación Española de Normalización in July of 2019.)
UNE-EN IEC 60749-17:2019 UNE
Status: Vigente/ 2019-06-01
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (Endorsed by Asociación Española de Normalización in June of 2019.)
UNE-EN IEC 61967-1:2019 UNE
Status: Vigente/ 2019-03-01
Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (Endorsed by Asociación Española de Normalización in March of 2019.)
UNE-EN IEC 62435-6:2018 UNE
Status: Vigente/ 2018-12-01
Electronic components - Long-term storage of electronic semiconductor devices - Part 6: Packaged or Finished Devices (Endorsed by Asociación Española de Normalización in December of 2018.)
UNE-EN IEC 62969-4:2018 UNE
Status: Vigente/ 2018-10-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in October of 2018.)
UNE-EN IEC 62435-4:2018 UNE
Status: Vigente/ 2018-09-01
Electronic components - Long-term storage of electronic semiconductor devices - Part 4: Storage (Endorsed by Asociación Española de Normalización in September of 2018.)
UNE-EN IEC 62969-3:2018 UNE
Status: Vigente/ 2018-08-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 3: Shock driven piezoelectric energy harvesting for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in August of 2018.)
UNE-EN IEC 62969-2:2018 UNE
Status: Vigente/ 2018-06-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN 60191-4:2014/A1:2018 UNE
Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN IEC 60749-26:2018 UNE
Status: Vigente/ 2018-05-01
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (Endorsed by Asociación Española de Normalización in May of 2018.)
UNE-EN IEC 60191-1:2018 UNE
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices (Endorsed by Asociación Española de Normalización in May of 2018.)
UNE-EN IEC 60749-13:2018 UNE
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (Endorsed by Asociación Española de Normalización in May of 2018.)
UNE-EN IEC 60749-12:2018 UNE
Status: Vigente/ 2018-04-01
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
UNE-EN IEC 62969-1:2018 UNE
Status: Vigente/ 2018-03-01
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 1: General requirements of power interface for automotive vehicle sensors (Endorsed by Asociación Española de Normalización in March of 2018.)
UNE-EN 60747-16-3:2002/A2:2017 UNE
Status: Vigente/ 2018-01-01
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by Asociación Española de Normalización in January of 2018.)
UNE-EN 60747-16-4:2004/A2:2017 UNE
Status: Vigente/ 2017-12-01
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (Endorsed by Asociación Española de Normalización in December of 2017.)
UNE-EN 60749-5:2017 UNE
Status: Vigente/ 2017-08-01
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
UNE-EN 60749-9:2017 UNE
Status: Vigente/ 2017-07-01
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking (Endorsed by Asociación Española de Normalización in July of 2017.)
UNE-EN 60747-16-1:2002/A2:2017 UNE
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by Asociación Española de Normalización in July of 2017.)
UNE-EN 60749-6:2017 UNE
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (Endorsed by Asociación Española de Normalización in July of 2017.)
