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Number of results 68
UNE-EN 61086-1:2004 UNE
Status: Vigente/ 2004-07-30
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
UNE-EN 61086-3-1:2004 UNE
Status: Vigente/ 2004-07-23
Coatings for loaded printed wire boards (conformal coatings) -- Part 3-1: Specifications for individual materials - Coatings for general purpose (Class 1), high reliability (Class 2) and aerospace (Class 3)
UNE-EN 61086-3-1:1996 UNE
Status: Anulada/ 2007-03-01
COATINGS FOR LOADED PRINTED WIRE BOARDS (CONFORMAL COATINGS). PART 3: SPECIFICATIONS FOR INDIVIDUAL MATERIALS. SHEET 1: COATINGS FOR GENERAL PURPOSE (CLASS I) AND FOR HIGH RELIABILITY (CLASS II).
UNE-EN 61086-2:1996 UNE
Status: Anulada/ 2007-04-01
SPECIFICATION FOR COATINGS FOR LOADED PRINTED WIRE BOARDS (CONFORMAL COATINGS). PART 2: METHODS OF TEST.
UNE-EN 61086-1:1996 UNE
SPECIFICATION FOR COATINGS FOR LOADED PRINTED WIRE BOARDS (CONFORMAL COATINGS). PART 1: DEFINITIONS, CLASSIFICATION AND GENERAL REQUIREMENTS.
UNE 21302-521:1992 UNE
Status: Anulada/ 2004-05-21
ELECTROTECHNICAL VOCABULARY. SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS.
UNE 21321:1978 UNE
Status: Vigente/ 1978-06-15
LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES AND INTEGRATED MICROCIRCUITS.
UNE-EN 160000:1993 UNE
Status: Vigente/ 1996-09-01
GS: MODULAR ELECTRONIC UNITS. (Endorsed by AENOR in September of 1996.)
UNE-EN 163100:1991 UNE
Status: Anulada/ 2023-09-28
Sectional Specification: Film and hybrid integrated circuits
UNE-EN 163101:1991 UNE
Blank Detail Specification: Film and hybrid integrated circuits
UNE-EN 165000-1:1996 UNE
Film and hybrid integrated circuits - Part 1: Generic specification - Capability approval procedure
UNE-EN 160000/A1:1995 UNE
Status: Vigente/ 1996-11-01
GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS (Endorsed by AENOR in November of 1996.)
UNE-EN 190101:1994 UNE
Family Specification: Digital integrated TTL circuits - Series 54, 64, 74, 84
UNE-EN 190102:1994 UNE
Family Specification: TTL-Schottky digital integrated circuits - Series 54S, 64S, 74S, 84S
UNE-EN 190103:1994 UNE
Family Specification: Digital integrated TTL low power Schottky circuits - Series 54LS, 64LS, 74LS, 84LS
UNE-EN 190106:1994 UNE
Family Specification: TTL advanced low power Schottky digital integrated circuits - Series 54ALS, 74ALS
UNE-EN 190107:1994 UNE
Family Specification: TTL FAST digital integrated circuits - Series 54F, 74F
UNE-EN 190108:1994 UNE
Family Specification: TTL advanced Schottky digital integrated circuits - Series 54AS, 74AS
UNE-EN 190109:1994 UNE
Family Specification: Digital integrated HC MOS circuits - Series HC/HCT/HCU
UNE-EN 190110:1994 UNE
Blank Detail Specification: Digital microprocessor integrated circuits
UNE-EN 190116:1993 UNE
Family Specification: AC MOS Digital integrated circuits
UNE-EN 190000:1992 UNE
Generic Specification: Monolithic integrated circuits
UNE-EN 190100:1993 UNE
Sectional Specification: Digital monolithic integrated circuits
UNE-EN 61943:1999 UNE
Status: Vigente/ 1999-11-01
INTEGRATED CIRCUITS. MANUFACTURING LINE APPROVAL APPLICATION GUIDELINE (Endorsed by AENOR in November of 1999.)
UNE-EN 165000-2:1996 UNE
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
UNE-EN 165000-3:1996 UNE
Film and hybrid integrated circuits - Part 3: Self-audit checklist and report for film and hybrid integrated circuit manufacturers
UNE-EN 165000-4:1996 UNE
Film and hybrid integrated circuits - Part 4: Customer information, product assessment level schedules and blank detail specification
UNE-EN 165000-5:1997 UNE
Status: Anulada/ 2023-09-21
Film and hybrid integrated circuits - Part 5: Procedure for qualification approval
UNE-ENV 50218:1996 UNE
Status: Anulada/ 2014-02-06
DESCRIPTION OF PARAMETRIZED EUROPEAN MINI TEST CHIP (Endorsed by AENOR in December of 1997.)
UNE-ENV 50219:1996 UNE
DESCRIPTION OF THE RELIABILITY TEST STRUCTURES OF THE EUROPEAN MINI TEST CHIP (Endorsed by AENOR in December of 1997.)
UNE-EN 61964:1999 UNE
Status: Vigente/ 2001-04-01
Integrated circuits - Memory devices pin configurations. (Endorsed by AENOR in April of 2001.)
UNE-EN 61967-4:2002 UNE
Status: Anulada/ 2024-04-21
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
UNE-EN 61967-1:2002 UNE
Status: Anulada/ 2022-01-17
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions
UNE-EN 61967-6:2002 UNE
Status: Vigente/ 2002-11-01
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
UNE-EN 61967-5:2003 UNE
Status: Vigente/ 2003-07-01
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 5: Measurement of conducted emissions - Workbench Faraday Cage method (Endorsed by AENOR in July of 2003.)
UNE-EN 62090:2003 UNE
Status: Anulada/ 2020-05-17
Product package labels for electronic components using bar code and two- dimensional symbologies
UNE-EN 61967-4:2002/A1:2006 UNE
UNE-EN 62132-1:2006 UNE
Status: Anulada/ 2018-12-04
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
UNE-EN 62132-5:2006 UNE
Status: Vigente/ 2006-04-01
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz -- Part 5: Workbench Faraday cage method (Endorsed by AENOR in April of 2006.)
UNE-EN 62132-4:2006 UNE
Status: Vigente/ 2006-08-01
Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz -- Part 4: Direct RF power injection method (IEC 62132-4:2006) (Endorsed by AENOR in August of 2006.)
UNE-EN 62132-3:2007 UNE
Status: Anulada/ 2021-10-28
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
UNE-EN 61967-6:2002/A1:2008 UNE
Status: Vigente/ 2008-09-01
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
UNE-EN 62433-2:2010 UNE
Status: Anulada/ 2020-03-04
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
UNE-EN 62132-2:2011 UNE
Status: Vigente/ 2011-07-01
Integrated circuits - Measurement of electromagnetic immunity -- Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (Endorsed by AENOR in July of 2011.)
UNE-EN 61967-8:2011 UNE
Status: Vigente/ 2012-01-01
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method (Endorsed by AENOR in January of 2012.)
UNE-EN 62132-8:2012 UNE
Status: Vigente/ 2012-11-01
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (Endorsed by AENOR in November of 2012.)
UNE-EN 62215-3:2013 UNE
Status: Vigente/ 2013-11-01
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (Endorsed by AENOR in November of 2013.)
UNE-EN 62228-2:2017 UNE
Status: Vigente/ 2017-03-01
Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
UNE-EN 61967-4:2002/AC:2017-07 UNE
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method (Endorsed by Asociación Española de Normalización in September of 2017.)
UNE-EN 62433-4:2016 UNE
Status: Vigente/ 2016-12-01
EMC IC modelling - Part 4: Models of Integrated Circuits for RF Immunity behavioural simulation - Conducted Immunity modelling (ICIM-CI) (Endorsed by AENOR in December of 2016.)
