Clear filters Apply
Results for:
Number of results 87
UNE-EN IEC 62031:2020/A11:2022 UNE
Status: Vigente/ 2022-09-28
LED modules for general lighting - Safety specifications
UNE-EN IEC 62384:2020 UNE
Status: Vigente/ 2020-10-07
DC or AC supplied electronic controlgear for LED modules - Performance requirements
UNE-EN IEC 62031:2020 UNE
Status: Vigente/ 2020-06-24
UNE-EN 62031:2009/A2:2015 UNE
Status: Anulada/ 2022-12-19
UNE-EN 62031:2009/A1:2013 UNE
UNE-EN 62031:2009 UNE
UNE 20822:1993 UNE
Status: Vigente/ 1993-12-29
IEC 822 VSB. PARALLEL SUB-SYSTEM BUS OF THE IEC 821 VMEBUS.
UNE 21821:1993 UNE
Status: Anulada/ 1997-11-19
MICROPROCESSOR SYSTEM BUS FOR 1 TO 4 BYTE DATA.
UNE 20700-11:1991 UNE
Status: Vigente/ 1991-09-12
SEMICONDUCTOR DEVICES. PART 11: SECTIONAL SPECIFICATION FOR DISCRETE DEVICES.
UNE-EN 60747-5-3:2001 UNE
Status: Anulada/ 2023-10-05
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
UNE-EN 60747-5-1:2001 UNE
Status: Anulada/ 2020-09-03
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
UNE-EN 60747-5-2:2001 UNE
Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
UNE-EN 60146-2:2000 UNE
Status: Vigente/ 2001-12-01
Semiconductor converters -- Part 2: Self-commutated semiconductor converters including direct d.c. converters (Endorsed by AENOR in December of 2001.)
UNE-EN 60747-16-1:2002 UNE
Status: Vigente/ 2002-07-01
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by AENOR in July of 2002.)
UNE-EN 60747-5-1:2001/A1:2002 UNE
UNE-EN 60747-16-3:2002 UNE
Status: Vigente/ 2002-12-01
Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters. (Endorsed by AENOR in December of 2002.)
UNE-EN 60747-5-1:2001/A2:2002 UNE
UNE-EN 60747-5-2:2001/A1:2002 UNE
UNE-EN 60747-5-3:2001/A1:2002 UNE
UNE-EN 60747-15:2004 UNE
Status: Anulada/ 2014-01-21
Discrete semiconductor devices -- Part 15: Isolated power semiconductor devices (Endorsed by AENOR in May of 2004.)
UNE-EN 60747-16-10:2004 UNE
Status: Vigente/ 2004-11-01
Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)
UNE-EN 60747-16-4:2004 UNE
Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (Endorsed by AENOR in November of 2004.)
UNE-EN 62258-2:2005 UNE
Status: Anulada/ 2014-06-29
Semiconductor die products -- Part 2: Exchange data formats (Endorsed by AENOR in September of 2005.)
UNE-EN 61967-2:2005 UNE
Status: Vigente/ 2006-01-01
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.)
UNE-EN 62258-1:2005 UNE
Status: Anulada/ 2013-10-01
Semiconductor die products -- Part 1: Requirements for procurement and use (Endorsed by AENOR in January of 2006.)
UNE-EN 62047-1:2006 UNE
Status: Anulada/ 2019-02-11
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
UNE-EN 62258-5:2006 UNE
Status: Vigente/ 2007-01-01
Semiconductor die products -- Part 5: Requirements for information concerning electrical simulation (IEC 62258-5:2006) (Endorsed by AENOR in January of 2007.)
UNE-EN 62258-6:2006 UNE
Semiconductor die products -- Part 6: Requirements for information concerning thermal simulation(IEC 62258-6:2006) (Endorsed by AENOR in January of 2007.)
UNE-EN 62047-2:2006 UNE
Semiconductor devices - Micro-electromechanical devices -- Part 2: Tensile testing method of thin film materials (IEC 62047-2:2006). (Endorsed by AENOR in January of 2007.)
UNE-EN 62047-3:2006 UNE
Semiconductor devices - Micro-electromechanical devices -- Part 3: Thin film standard test piece for tensile testing (IEC 62047-3:2006) (Endorsed by AENOR in January of 2007.)
UNE-EN 60747-16-1:2002/A1:2007 UNE
Status: Vigente/ 2007-05-01
Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001/A1:2007). (Endorsed by AENOR in May of 2007.)
UNE-EN 60747-16-3:2002/A1:2009 UNE
Status: Vigente/ 2009-07-01
Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by AENOR in July of 2009.)
UNE-EN 62047-6:2010 UNE
Status: Vigente/ 2010-06-01
Semiconductor devices - Micro-electromechanical devices -- Part 6: Axial fatigue testing methods of thin film materials (Endorsed by AENOR in June of 2010.)
UNE-EN 62047-4:2010 UNE
Status: Vigente/ 2011-02-01
Semiconductor devices - Micro-electromechanical devices -- Part 4: Generic specification for MEMS (Endorsed by AENOR in February of 2011.)
UNE-EN 62258-1:2010 UNE
Semiconductor die products -- Part 1: Procurement and use (Endorsed by AENOR in February of 2011.)
UNE-EN 60747-5-5:2011 UNE
Status: Anulada/ 2023-08-25
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
UNE-EN 60747-16-4:2004/A1:2011 UNE
Status: Vigente/ 2011-04-01
Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (Endorsed by AENOR in April of 2011.)
UNE-EN 62047-5:2011 UNE
Status: Vigente/ 2011-11-01
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches (Endorsed by AENOR in November of 2011.)
UNE-EN 62047-7:2011 UNE
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection (Endorsed by AENOR in November of 2011.)
UNE-EN 62047-12:2011 UNE
Status: Vigente/ 2012-02-01
Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (Endorsed by AENOR in February of 2012.)
UNE-EN 62047-10:2011 UNE
Status: Vigente/ 2011-12-01
Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)
UNE-EN 62258-2:2011 UNE
Status: Vigente/ 2011-10-01
Semiconductor die products - Part 2: Exchange data formats (Endorsed by AENOR in October of 2011.)
UNE-EN 62047-8:2011 UNE
Status: Vigente/ 2011-09-01
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (Endorsed by AENOR in September of 2011.)
UNE-EN 60747-15:2012 UNE
Status: Vigente/ 2012-06-01
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-9:2011 UNE
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-14:2012 UNE
Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-13:2012 UNE
Semiconductor devices - Micro-electromechanical devices - Part 13: Bend- and shear- type test methods of measuring adhesive strength for MEMS structures (Endorsed by AENOR in June of 2012.)
UNE-EN 62047-19:2013 UNE
Status: Vigente/ 2013-11-01
Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses (Endorsed by AENOR in November of 2013.)
UNE-EN 62047-18:2013 UNE
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)
UNE-EN 62047-11:2013 UNE
Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems (Endorsed by AENOR in November of 2013.)
