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IEC 60749-6:2002

IEC 60749-6:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 6: Stockage à haute température

Date:
2017-03-03 /Anulada
Summary (English):
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
Summary (French):
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