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IEC 60749-36:2003

IEC 60749-36:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 36: Accélération constante

Date:
2003-02-13 /Vigente
Summary (English):
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Summary (French):

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