IEC PAS 62205:2000

High temperature storage life

Date:

2002-07-01 /Anulada

Summary (English):

Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.

Summary (French):

Relaciones con otras normas IEC

Es anulada por: IEC 60749-6:2002

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