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Standard
IEC 62276:2005

IEC 62276:2005

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Date:
2012-10-19 /Anulada
Summary (English):
Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.
Summary (French):
Relaciones con otras normas IEC

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