IEC 60749-29:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 29: Essai de verrouillage

Date:

2011-04-07 /Anulada

Summary (English):

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstress" failures due to latch-up.

Summary (French):

Relaciones con otras normas IEC

Es anulada por: IEC 60749-29:2011

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